Sample characterization in National Labs

We collaborate with Scientist in National Labs and employ advanced characterization tools (e.g. synchrotron x-ray and neutron) there to investigate intrinsic material properties.

X-ray Diffractions

6-circle diffractometer at Advanced Light Source in ANL
6-circle diffractometer at Advanced Photon Source in Argonne National Lab.

X-ray Spectroscopy

X-ray Photoemission at Brookhaven National Lab  
X-ray Photoemission at Brookhaven National Lab.
X-ray Photoemission Electron Microscopy Structural domains imaged using PEEM
Left: X-ray Photoemission at the Canadian Light Source.
Right:Structural domains imaged using PEEM. 


Neutron Diffraction

Neutron beam will go through the sample under the floor Image map of the neutron detectors
Left: Neutron beam will go through the sample under the floor, Oak Ridge National Lab.
Right:Image map of the neutron detectors.