Sample Characterization

Atomic Force Microscope

TT-AFM Al2O3 SrTiO3
Left: TT-AFM from AFM Workshop capable of up to approximately 0.1 nm resolution. 
Middle: A sample image of 5X5 micron Al2O3 (0001) surface. 
Right: A sample image of 2X2 micron SrTiO3 (001) surface.

Transport Measurement System
Transport Measurement System