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Sample Characterization

Atomic Force Microscope

TT-AFM — Left: TT-AFM from AFM Workshop capable of up to approximately 0.1 nm resolution.
Right: A sample image of 2X2 micron SrTiO3 (001) surface.

SrTiO3 — Left: TT-AFM from AFM Workshop capable of up to approximately 0.1 nm resolution.
Right: A sample image of 2X2 micron SrTiO3 (001) surface.

Magneto-transport/Magneto-optical System

Transport Measurement System

Magneto-transport/magneto-dielectric Measurement System

Transport Measurement System

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