Sample Characterization

Atomic Force Microscope

TT-AFM SrTiO3
Left: TT-AFM from AFM Workshop capable of up to approximately 0.1 nm resolution. 
Right: A sample image of 2X2 micron SrTiO3 (001) surface.

Magneto-transport/Magneto-optical System

Transport Measurement System

Magneto-transport/magneto-dielectric Measurement System

   

Transport Measurement System Transport Measurement System